Search results for: B. Govoreanu
2016 IEEE International Electron Devices Meeting (IEDM) > 21.4.1 - 21.4.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
Microelectronic Engineering > 2015 > 147 > C > 171-175
IEEE Electron Device Letters > 2015 > 36 > 8 > 769 - 771
2013 IEEE International Electron Devices Meeting > 10.2.1 - 10.2.4
Microelectronic Engineering > 2013 > 112 > Complete > 92-96
Microelectronic Engineering > 2013 > 109 > Complete > 177-181
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.3.1 - 5E.3.7