Search results for: D.H. Tassis
Solid State Electronics > 2012 > 69 > Complete > 55-61
Microelectronic Engineering > 2012 > 90 > Complete > 9-11
Solid State Electronics > 2011 > 64 > 1 > 34-41
Solid State Electronics > 2011 > 57 > 1 > 31-34
Microelectronic Engineering > 2010 > 87 > 9 > 1764-1768
Microelectronic Engineering > 2010 > 87 > 11 > 2353-2357
Microelectronics Reliability > 2008 > 48 > 4 > 531-536
Solid State Electronics > 2007 > 51 > 5 > 726-731
IEEE Transactions on Electron Devices > 2007 > 54 > 5 > 1076 - 1082
IEEE Electron Device Letters > 2007 > 28 > 9 > 803 - 805
IEEE Transactions on Electron Devices > 2007 > 54 > 5 > 1265 - 1269
Microelectronics Reliability > 2006 > 46 > 12 > 2032-2037
Solid State Electronics > 2006 > 50 > 3 > 340-344
Microelectronics Reliability > 2006 > 46 > 2-4 > 311-316
Solid State Electronics > 2005 > 49 > 3 > 513-515
Solid State Electronics > 2003 > 47 > 1 > 25-31
Thin Solid Films > 1997 > 310 > 1-2 > 115-122
Applied Surface Science > 1996 > 102 > 178-183