Search results for: A.T. Hatzopoulos
Microelectronics Reliability > 2008 > 48 > 4 > 531-536
Solid State Electronics > 2007 > 51 > 5 > 726-731
IEEE Transactions on Electron Devices > 2007 > 54 > 5 > 1076 - 1082
IEEE Electron Device Letters > 2007 > 28 > 9 > 803 - 805
IEEE Transactions on Electron Devices > 2007 > 54 > 5 > 1265 - 1269
Microelectronics Reliability > 2006 > 46 > 12 > 2032-2037
Microelectronics Reliability > 2006 > 46 > 2-4 > 311-316