Search results for: N. Arpatzanis
Microelectronics Reliability > 2011 > 51 > 3 > 556-559
Microelectronics Reliability > 2008 > 48 > 4 > 531-536
Thin Solid Films > 2007 > 515 > 19 > 7581-7584
Solid State Electronics > 2007 > 51 > 5 > 726-731
IEEE Transactions on Electron Devices > 2007 > 54 > 5 > 1076 - 1082
IEEE Electron Device Letters > 2007 > 28 > 9 > 803 - 805
IEEE Transactions on Electron Devices > 2007 > 54 > 5 > 1265 - 1269
Microelectronics Reliability > 2006 > 46 > 12 > 2032-2037
Microelectronics Reliability > 2006 > 46 > 2-4 > 311-316
Solid State Electronics > 1998 > 42 > 2 > 277-282
Applied Surface Science > 1995 > 90 > 1 > 39-45