Search results for: C.D. Young
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.1.1 - XT.1.4
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 626 - 631
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1322 - 1329
IEEE Electron Device Letters > 2008 > 29 > 2 > 180 - 182
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1338 - 1345
IEEE Electron Device Letters > 2007 > 28 > 8 > 734 - 736