Search results
IEEE Electron Device Letters > 2012 > 33 > 1 > 35 - 37
IEEE Electron Device Letters > 2012 > 33 > 5 > 703 - 705
IEEE Electron Device Letters > 2012 > 33 > 6 > 884 - 886
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2589 - 2596
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 399 - 405
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 933 - 940
IEEE Electron Device Letters > 2012 > 33 > 3 > 426 - 428
IEEE Electron Device Letters > 2012 > 33 > 3 > 423 - 425
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 459 - 467