Search results for: Shuang-Yuan Chen
Microelectronics Reliability > 2015 > 55 > 11 > 2203-2207
IEEE Electron Device Letters > 2011 > 32 > 5 > 584 - 586
Microelectronics Reliability > 2010 > 50 > 6 > 839-846
Solid State Electronics > 2010 > 54 > 5 > 527-529