Search results
Advanced Functional Materials > 33 > 45 > n/a - n/a
IEEE Electron Device Letters > 2017 > 38 > 10 > 1371 - 1374
Microelectronics Reliability > 2017 > 76-77 > C > 610-613
Journal of Electronic Materials > 2017 > 46 > 8 > 5296-5302
2017 IEEE International Reliability Physics Symposium (IRPS) > WB-1.1 - WB-1.6
Microelectronics Reliability > 2016 > 64 > C > 189-193
Microelectronics Reliability > 2016 > 63 > C > 97-103
Microelectronic Engineering > 2015 > 147 > C > 141-144
IET Micro & Nano Letters > 2015 > 10 > 10 > 541 - 544
Microelectronics Reliability > 2014 > 54 > 9-10 > 2167-2170
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2509 - 2514