Search results
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-4.1 - 2D-4.7
Journal of Microelectromechanical Systems > 2017 > 26 > 2 > 406 - 414
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1007 - 1014
IEEE Sensors Journal > 2017 > 17 > 5 > 1255 - 1263
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
2016 IEEE SENSORS > 1 - 3
Journal of Microelectromechanical Systems > 2016 > 25 > 3 > 549 - 556
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-4-1 - CD-4-5
Journal of Microelectromechanical Systems > 2015 > 24 > 6 > 1951 - 1959
2015 IEEE International Electron Devices Meeting (IEDM) > 8.5.1 - 8.5.4
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 11 > 1559 - 1566