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IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Multi-Scale Computing Systems > 2017 > 3 > 2 > 72 - 85
2016 IEEE International Reliability Physics Symposium (IRPS) > CR-3-1 - CR-3-4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.5.1 - 11.5.4