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2011 International Reliability Physics Symposium > 3D.3.1 - 3D.3.10
2009 IEEE Custom Integrated Circuits Conference > 207 - 210
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2703 - 2711
IEEE Transactions on Aerospace and Electronic Systems > 1966 > AES-2 > 2 > 169 - 174