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2017 IEEE International Reliability Physics Symposium (IRPS) > XT-4.1 - XT-4.5
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4167 - 4172
IEEE Electron Device Letters > 2016 > 37 > 8 > 962 - 965
IEEE Electron Device Letters > 2016 > 37 > 8 > 958 - 961
2014 International SoC Design Conference (ISOCC) > 112 - 113
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2711 - 2718
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3277 - 3284
IEEE Electron Device Letters > 2012 > 33 > 6 > 767 - 769