Search results
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3825 - 3831
2015 IEEE International Reliability Physics Symposium > 2F.4.1 - 2F.4.5
2015 IEEE International Reliability Physics Symposium > 4A.2.1 - 4A.2.5
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 757 - 763
IEEE Electron Device Letters > 2015 > 36 > 2 > 177 - 179
IEEE Electron Device Letters > 2014 > 35 > 2 > 181 - 183
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.6.1 - 4A.6.5
IEEE Electron Device Letters > 2013 > 34 > 5 > 635 - 637
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.6.1 - XT.6.7
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1501 - 1509
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1385 - 1392
2011 International Reliability Physics Symposium > 4E.3.1 - 4E.3.4