Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 41 - 48
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2526 - 2532
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1020 - 1025
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 805 - 808
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1808 - 1813
2015 IEEE International Electron Devices Meeting (IEDM) > 6.2.1 - 6.2.4
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2878 - 2882
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1226 - 1232
IEEE Transactions on Nuclear Science > 2014 > 61 > 5-2 > 2702 - 2710
IEEE Electron Device Letters > 2014 > 35 > 6 > 639 - 641
IEEE Electron Device Letters > 2014 > 35 > 5 > 554 - 556
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4079 - 4084
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.3.1 - 6A.3.6