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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 307 - 315
IEEE Electron Device Letters > 2017 > 38 > 4 > 430 - 433
IEEE Transactions on Information Forensics and Security > 2016 > 11 > 12 > 2804 - 2817
IEEE Electron Device Letters > 2016 > 37 > 10 > 1268 - 1271
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 388 - 395
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 6 > 903 - 914