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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 12 > 3407 - 3415
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3120 - 3123
2011 International Reliability Physics Symposium > XT.3.1 - XT.3.5
IEEE Transactions on Industry Applications > 1982 > IA-18 > 3 > 273 - 278