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2011 International Reliability Physics Symposium > 3B.4.1 - 3B.4.8
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398
IEEE Transactions on Microwave Theory and Techniques > 2009 > 57 > 12-2 > 3163 - 3170
IEEE Transactions on Industrial Electronics > 2009 > 56 > 6 > 2133 - 2139
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1063 - 1069
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 491 - 500