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IEEE Electron Device Letters > 2014 > 35 > 8 > 862 - 864
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.4.1 - 4C.4.4
2011 International Reliability Physics Symposium > 5A.6.1 - 5A.6.6
IEEE Instrumentation & Measurement Magazine > 2011 > 14 > 1 > 24 - 31
2010 IEEE International Reliability Physics Symposium > 1082 - 1085
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 458 - 465
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 390 - 395