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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2561 - 2574
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-5-1 - 4B-5-8
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 540 - 546
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 164 - 170
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 3 > 652 - 659
IEEE Instrumentation & Measurement Magazine > 2011 > 14 > 1 > 24 - 31
2010 International Electron Devices Meeting > 2.1.1 - 2.1.4
2010 International SoC Design Conference > 21 - 24