Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 37 - 44
2016 IEEE International Electron Devices Meeting (IEDM) > 31.2.1 - 31.2.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-2-1 - 4B-2-7
2015 IEEE International Reliability Physics Symposium > 2F.4.1 - 2F.4.5
2013 IEEE International Electron Devices Meeting > 15.2.1 - 15.2.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 497 - 506
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 405 - 412
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 396 - 404
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.4.1 - 5A.4.6
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2011 International Reliability Physics Symposium > CD.1.1 - CD.1.6
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4