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2016 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
IEEE Journal of the Electron Devices Society > 2016 > 4 > 3 > 144 - 148
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 69 - 73
Proceedings of the IEEE > 2014 > 102 > 1 > 35 - 52
2013 IEEE International Reliability Physics Symposium (IRPS) > 3E.1.1 - 3E.1.5
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1681 - 1689