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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 422 - 431
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 32.3.1 - 32.3.4
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 208 - 209
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 170 - 171
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1428 - 1436