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IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-7.1 - CR-7.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-8.1 - CR-8.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-5.1 - 6A-5.6
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-4-1 - 4B-4-6
2015 IEEE International Electron Devices Meeting (IEDM) > 20.5.1 - 20.5.6