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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-5.1 - 6A-5.6
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 186 - 187
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Electron Device Letters > 2012 > 33 > 4 > 486 - 488
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3133 - 3136
IEEE Electron Device Letters > 2012 > 33 > 2 > 137 - 139
2011 International Reliability Physics Symposium > HV.1.1 - HV.1.4
2011 International Reliability Physics Symposium > 3D.1.1 - 3D.1.7
2011 International Reliability Physics Symposium > PL.1.1 - PL.1.5
2011 International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 408 - 410