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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 194 - 200
2009 IEEE Sensors > 727 - 730
IEEE Electron Device Letters > 2008 > 29 > 2 > 192 - 194
IEEE Transactions on Electron Devices > 2008 > 55 > 6 > 1352 - 1358
IEEE Electron Device Letters > 2008 > 29 > 7 > 750 - 752
IEEE Electron Device Letters > 2008 > 29 > 7 > 768 - 770
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2475 - 2483