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2011 International Reliability Physics Symposium > 2B.6.1 - 2B.6.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
2009 31st EOS/ESD Symposium > 1 - 8
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 459 - 464
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1086 - 1093
IEEE Electron Device Letters > 2009 > 30 > 3 > 298 - 301
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
IEEE Electron Device Letters > 2008 > 29 > 9 > 1062 - 1064