Search results
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1308 - 1321
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3090 - 3095
2013 IEEE International Reliability Physics Symposium (IRPS) > 5C.6.1 - 5C.6.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.3.1 - 2B.3.5
Design Automation Conference > 803 - 806