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2011 International Reliability Physics Symposium > 2B.6.1 - 2B.6.5
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2347 - 2353
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3570 - 3574
2009 Spanish Conference on Electron Devices > 238 - 241
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 459 - 464