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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-5.1 - 4C-5.6
IEEE Electron Device Letters > 2015 > 36 > 10 > 991 - 993
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 11 > 726 - 730
2009 46th ACM/IEEE Design Automation Conference > 310 - 313
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 59 - 65