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2016 IEEE International Reliability Physics Symposium (IRPS) > DI-2-1 - DI-2-5
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2406 - 2414
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 219 - 226
IEEE Electron Device Letters > 2010 > 31 > 2 > 165 - 167
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1681 - 1689
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 491 - 500
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 502 - 508
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 540 - 557