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IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 12 > 1954 - 1967
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-5.1 - 4C-5.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 4B-5.1 - 4B-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-2.1 - 2D-2.7
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 113 - 120
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 11 > 1034 - 1038
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2722 - 2728