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IEEE Journal of Solid-State Circuits > 2017 > 52 > 4 > 925 - 932
2015 IEEE International Reliability Physics Symposium > 3D.1.1 - 3D.1.8
2012 International Electron Devices Meeting > 31.7.1 - 31.7.4
IEEE Electron Device Letters > 2011 > 32 > 2 > 116 - 118
IEEE Transactions on Nuclear Science > 2009 > 56 > 3-2 > 1051 - 1055