Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2449 - 2457
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2384 - 2390
2015 IEEE International Reliability Physics Symposium > 2F.3.1 - 2F.3.5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 11 > 2350 - 2356
2013 IEEE International Reliability Physics Symposium (IRPS) > 3B.6.1 - 3B.6.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.4.1 - 2D.4.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.5.1 - 6A.5.7
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.4.1 - 6A.4.9
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 4 > 616 - 629
2011 International Reliability Physics Symposium > 2D.4.1 - 2D.4.6
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83