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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 475 - 482
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3508 - 3513
2011 IEEE International Ultrasonics Symposium > 2313 - 2316
IEEE Journal of Selected Topics in Quantum Electronics > 2011 > 17 > 4 > 966 - 970
IEEE Electron Device Letters > 2011 > 32 > 11 > 1564 - 1566
IEEE Electron Device Letters > 2011 > 32 > 1 > 54 - 56