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2011 International Reliability Physics Symposium > 3D.4.1 - 3D.4.7
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 672 - 676
Journal of Microelectromechanical Systems > 2010 > 19 > 3 > 443 - 450
IEEE Electron Device Letters > 2009 > 30 > 7 > 715 - 717
2008 IEEE Sensors > 156 - 159
Electronics Letters > 2008 > 44 > 6 > 411 - 412