Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4091 - 4098
IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
IEEE Electron Device Letters > 2017 > 38 > 4 > 445 - 448
IEEE Electron Device Letters > 2015 > 36 > 10 > 1030 - 1032
2015 IEEE International Reliability Physics Symposium > 5B.5.1 - 5B.5.6
IEEE Electron Device Letters > 2014 > 35 > 6 > 636 - 638
IEEE Journal of the Electron Devices Society > 2014 > 2 > 6 > 154 - 157
IEEE Electron Device Letters > 2014 > 35 > 10 > 1022 - 1024
2013 IEEE International Electron Devices Meeting > 10.6.1 - 10.6.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.4.1 - 5E.4.4
2013 Spanish Conference on Electron Devices > 281 - 284
IEEE Electron Device Letters > 2013 > 34 > 10 > 1292 - 1294
IEEE Electron Device Letters > 2013 > 34 > 10 > 1250 - 1252
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 93 - 97
2012 International Electron Devices Meeting > 20.1.1 - 20.1.4