Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1482 - 1488
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 121 - 129
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 227 - 234
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 6 > 2321 - 2334
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 316 - 323
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 114 - 120
2013 5th IEEE International Memory Workshop > 163 - 165
IEEE Electron Device Letters > 2012 > 33 > 2 > 218 - 220
2011 International Reliability Physics Symposium > MY.2.1 - MY.2.5
2011 International Reliability Physics Symposium > GD.1.1 - GD.1.6
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 770 - 775
IEEE Electron Device Letters > 2011 > 32 > 6 > 731 - 733