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2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1065 - 1068
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2113 - 2118
IEEE Transactions on Nanotechnology > 2013 > 12 > 6 > 1018 - 1021
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 3 > 580 - 584
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.2.1 - GD.2.4
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.5.1 - XT.5.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1183 - 1185
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 166 - 170
2011 International Reliability Physics Symposium > GD.1.1 - GD.1.6
2011 International Reliability Physics Symposium > 2B.1.1 - 2B.1.8
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1023 - 1028
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 9 > 1321 - 1334
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 7 > 1054 - 1063
IEEE Transactions on Circuits and Systems I: Regular Papers > 2011 > 58 > 9 > 2026 - 2037
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2904 - 2910