Search results
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2391 - 2397
2015 IEEE International Reliability Physics Symposium > 5A.5.1 - 5A.5.5
2015 IEEE International Reliability Physics Symposium > GD.3.1 - GD.3.5
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 934 - 939
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 408 - 412
2013 IEEE International Reliability Physics Symposium (IRPS) > GD.1.1 - GD.1.4
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
IEEE Electron Device Letters > 2013 > 34 > 2 > 295 - 297
IEEE Electron Device Letters > 2013 > 34 > 8 > 960 - 962
2012 IEEE International Reliability Physics Symposium (IRPS) > 5C.1.1 - 5C.1.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 5C.3.1 - 5C.3.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 5A.1.1 - 5A.1.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1183 - 1185
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 399 - 405