Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 85 - 94
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4430 - 4434
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2248 - 2257
IEEE Electron Device Letters > 2017 > 38 > 5 > 677 - 680
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2142 - 2147
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-6.1 - DG-6.3
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 164 - 169
IEEE Electron Device Letters > 2016 > 37 > 12 > 1547 - 1550
IEEE Transactions on Nuclear Science > 2016 > 63 > 5-2 > 2731 - 2737
IEEE Transactions on Power Electronics > 2016 > 31 > 8 > 5863 - 5870
IEEE Electron Device Letters > 2016 > 37 > 5 > 644 - 647
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-3-1 - DI-3-5