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IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 6 > 2049 - 2051
IEEE Journal of Solid-State Circuits > 2017 > 52 > 5 > 1295 - 1304
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 2 > 176 - 180
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 12 > 3513 - 3525
IEEE Journal of Solid-State Circuits > 2016 > 51 > 10 > 2357 - 2367
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 9 > 2911 - 2917
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 9 > 2899 - 2910
IEEE Transactions on Power Electronics > 2016 > 31 > 8 > 5635 - 5643
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3028 - 3035
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3354 - 3359
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 2999 - 3004
IEEE Journal of Solid-State Circuits > 2016 > 51 > 8 > 1785 - 1796
IEEE Transactions on Electromagnetic Compatibility > 2016 > 58 > 4-1 > 1236 - 1239
Electronics Letters > 2016 > 52 > 14 > 1211 - 1212