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2011 International Reliability Physics Symposium > 2C.2.1 - 2C.2.10
2011 International Reliability Physics Symposium > BD.2.1 - BD.2.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 273 - 277
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 278 - 289
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1319 - 1328
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 9 > 1376 - 1380
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 120 - 127
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 350 - 357