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Microelectronics Reliability > 2018 > 87 > C > 106-112
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3748 - 3755
IEEE Transactions on Power Electronics > 2017 > 32 > 8 > 6434 - 6443
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-9-1 - XT-9-4
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 11 > 1582 - 1589