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Proceedings of the IEEE > 2017 > 105 > 9 > 1634 - 1649
IEEE Electron Device Letters > 2016 > 37 > 11 > 1418 - 1421
2015 IEEE International Electron Devices Meeting (IEDM) > 3.2.1 - 3.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 3.3.1 - 3.3.4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 136 - 141
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2064 - 2070
2013 5th IEEE International Memory Workshop > 151 - 154
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.12.1 - MY.12.5
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2331 - 2337