Szukanie zaawansowane
Szukanie zaawansowane w ludziach
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2804 - 2811
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-1.1 - 2B-1.5
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-5.1 - DG-5.6
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 945 - 952
2016 IEEE International Electron Devices Meeting (IEDM) > 31.8.1 - 31.8.4
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-3-1 - DI-3-5
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
2015 IEEE International Electron Devices Meeting (IEDM) > 14.3.1 - 14.3.4
IEEE Electron Device Letters > 2015 > 36 > 10 > 991 - 993
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 191 - 197
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 316 - 323
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 672 - 680