Search results for: Karlheinz Bock
Microelectronics Reliability > 2018 > 87 > C > 125-132
Journal of Lightwave Technology > 2017 > 35 > 18 > 4033 - 4039
Ceramics International > 2014 > 40 > 10 Part A > 15753- 15761
Microelectronics Reliability > 2018 > 87 > C > 125-132
Journal of Lightwave Technology > 2017 > 35 > 18 > 4033 - 4039
Ceramics International > 2014 > 40 > 10 Part A > 15753- 15761