Search results for: L. Date
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.2.1 - 4C.2.10
IEEE Electron Device Letters > 2013 > 34 > 1 > 3 - 5
Microelectronic Engineering > 2011 > 88 > 7 > 1164-1167
IEEE Electron Device Letters > 2010 > 31 > 2 > 123 - 125
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1548 - 1558
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3123 - 3132
IEEE Electron Device Letters > 2009 > 30 > 2 > 171 - 173
Microelectronics Reliability > 2007 > 47 > 4-5 > 521-524
Surface & Coatings Technology > 1999 > 116-119 > Complete > 1042-1048