Search results for: Daniel Donoval
Microelectronics Reliability > 2017 > 78 > C > 148-155
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 333 - 336
Lecture Notes in Computer Science > Computer Aided Learning and Instruction in Science and Engineering > 365-373
More than Moore > 203-238
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 828 - 834
Applied Surface Science > 2014 > 312 > C > 145-151