Search results for: Ales Chvala
Microelectronics Reliability > 2017 > 78 > C > 148-155
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 333 - 336
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 828 - 834
Applied Surface Science > 2014 > 312 > C > 145-151
Solid State Electronics > 2014 > 94 > Complete > 44-50
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 1116 - 1122