Search results for: Yu Cao
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-5.1 - CR-5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > CM.3.1 - CM.3.5
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 340 - 349
DAC Design Automation Conference 2012 > 139 - 144
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 4 > 615 - 628
2009 IEEE Custom Integrated Circuits Conference > 427 - 430
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 509 - 517
IEEE Custom Integrated Circuits Conference 2006 > 189 - 192